| (SPM) is a branch of microscopy that forms
images of surfaces using a physical probe or the
sample to scan the specimen. An image of the
surface is obtained by mechanically moving the
probe in a
raster scan of the specimen, line by line,
and recording the probe-surface interaction as a
function of position. SPM gives an opportunity
to carry out studies of spatial, physical and
chemical properties of objects with the typical
dimensions of less than a few nanometers. Owing
to its multifunctionality, availability and
simplicity, Atomic-Force Microscope (AFM) has
become one of the most prevailing “tools for
nanotechnology” |
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Scope Configurations |
Probe NanoLaboratory NTEGRA
>Info |
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NTEGRA Aura - Low Vacuum
>Info |
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NTEGRA Prima
>Info |
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NTEGRA Therma
>Info
>Video |
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Configured Scanning Modes |
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Contact AFM |
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Non-contact AFM |
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Dynamic contact AFM |
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EFM,
electrostatic force microscope |
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KPFM,
kelvin probe force microscopy |
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PFM, Piezo Force Microscopy |
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MFM,
magnetic force microscopy |
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SECM, scanning electrochemical |
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SCM,
scanning capacitance |
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SGM,
scanning gate microscopy |
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STM,
scanning tunneling microscopy |
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SVM,
scanning voltage microscopy |
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Application Areas |
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Life Sciences (Biology- BioTech) |
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Semiconductors |
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Polymers & Thin organic films |
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Magnetic measurements |
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Data storage |
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HDsems™
Methods
Scanning Probe / AFM Lab