Analytical Electron Microscopy


Electron Microscopy Laboratory
Transmission Electron Microscopes (TEM)
Zeiss EM-10 TEM
Jeol 100-S TEM
Scanning Electron Microscopes (SEM)
ISI-40 SEM
Jeol JSM-35C SEM
Capabilities
Research and Development
Device testing and characterization
Nanometrology
Nanoprototyping
Materials qualification
Electron beam induced deposition
Industry
High-resolution imaging
2D & 3D micro-characterization
Macro sample to nanometer metrology
Particle detection and characterization
Direct beam-writing fabrication
Dynamic materials experiments
Forensics
Mineral Liberation Analysis
Chemical/Petrochemical
Semiconductor & Data Storage 
Circuit edit
Defect analysis
Failure analysis
Life Sciences and Biology
Cryobiology
Protein localization
Electron tomography
Cellular tomography
Cryo-electron microscopy
Toxicology
Biological Production
Pharmaceutical QC
3D tissue imaging
Virology
Verification


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